Size effects on the microchemistry and plasticity of Stober silica particles: A study using EFTEM, FESEM, and AFM-SEPM microscopies

Langmuir

Volumn 17, Issue 1, 2001, Pages 189-194

  Rodrigues Costa, Carlos Alberto ^a   Paula Leite, Carlos Alberto ^a   De Souza, Elizabeth Fátima ^b   Galembeck, Fernando ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b PONTIFÍCIA UNIVERSIDADE CATÓLICA DE CAMPINAS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; BACKSCATTERING; DEFORMATION; DISPERSIONS; ELECTRIC POTENTIAL; ELECTRON SCATTERING; PARTICLE SIZE ANALYSIS; POROSITY; SCANNING ELECTRON MICROSCOPY; SUPERPLASTICITY; TRANSMISSION ELECTRON MICROSCOPY;

MICROCHEMISTRY; SCANNING PROBE MICROSCOPY;

SILICA;

EID: 0035124537     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la000408+     Document Type: Article

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