Generalized model for the lifetime of microelectronic components, applied to storage conditions

Microelectronics Reliability

Volumn 41, Issue 2, 2001, Pages 317-322

  Wise, Loren J ^a   Schrimpf, Ronald D ^b   Parks, Harold G ^c   Galloway, Kenneth F ^b  

^a MOTOROLA INC   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c University of Arizona   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; LIFE CYCLE; POISSON DISTRIBUTION; SEMICONDUCTOR DEVICE MODELS; STATISTICAL METHODS;

MICROCIRCUIT LIFETIME PREDICTIONS;

MICROELECTRONICS;

EID: 0035120854     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(00)00220-1     Document Type: Article

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