Importance sampling for spatial scan analysis: Computing scan statistic p-values for marked point processes

Computational Statistics and Data Analysis

Volumn 35, Issue 4, 2001, Pages 475-485

  Priebe, Carey E ^a   Naiman, Daniel Q ^a   Cope, Leslie M ^a  

^a Johns Hopkins University   (United States)

Author keywords

Importance sampling; Marked point pattern; Minefield; Spatial scan analysis

Indexed keywords

SPATIAL ANALYSIS;

EID: 0035112181     PISSN: 01679473     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9473(00)00017-7     Document Type: Article

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