메뉴 건너뛰기




Volumn 13, Issue 1, 2001, Pages 39-40

Tin pest in lead-free solders

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; LEAD ALLOYS; PHASE TRANSITIONS; QUENCHING; RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; SOLDERED JOINTS; THERMAL EFFECTS; TIN;

EID: 0035112052     PISSN: 09540911     EISSN: None     Source Type: Journal    
DOI: 10.1108/09540910110361730     Document Type: Article
Times cited : (46)

References (2)
  • 1
    • 0004086226 scopus 로고
    • Edward Arnold, London
    • Hedges, H.E. (1960), Tin and its Alloys, Edward Arnold, London, pp. 51-3.
    • (1960) Tin and Its Alloys , pp. 51-53
    • Hedges, H.E.1
  • 2
    • 0003146592 scopus 로고    scopus 로고
    • Lead free interconnect materials for the electronics industry
    • Napp, D. (1996), "Lead free interconnect materials for the electronics industry", SAMPE Journal, Vol. 32 No. 59, pp. 59-65.
    • (1996) SAMPE Journal , vol.32 , Issue.59 , pp. 59-65
    • Napp, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.