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Volumn 26, Issue 1, 2001, Pages 27-31
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The concept of sensitivity in sediment yield modelling
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Author keywords
[No Author keywords available]
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Indexed keywords
INTERRILL EROSION;
NUMERICAL MODEL;
PARAMETERIZATION;
SEDIMENT YIELD;
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EID: 0035110661
PISSN: 14641909
EISSN: None
Source Type: Journal
DOI: 10.1016/S1464-1909(01)85010-3 Document Type: Article |
Times cited : (14)
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References (14)
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