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Volumn 279, Issue 3, 2001, Pages 214-220

Surface characterization of atomic oxygen beam-exposed polyimide films using contact angle measurements

Author keywords

Atomic force microscopy; Atomic oxygen; Contact angle; Polyimide; Surface free energy; X ray photoelectron spectroscopy

Indexed keywords

ACID; BASE; FUNCTIONAL GROUP; OXYGEN; POLYIMIDE;

EID: 0035108493     PISSN: 0303402X     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003960000414     Document Type: Article
Times cited : (30)

References (27)
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    • NASA TM-4527
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    • Anderson, B.J.1
  • 6
    • 0005802495 scopus 로고    scopus 로고
    • 8th International Symposium on Materials in a Space Environment, 5th International Conference on Protection of Materials and Structures from the LEO Space Environment. Arcachon, France, in press
    • (2000)
    • Kinoshita, H.1    Yokota, K.2    Tagawa, M.3    Ohmae, N.4
  • 19
    • 0004009005 scopus 로고
    • Mittal KL (ed), Contact Angle, Wettability and Adhesion. VSP, Utrecht
    • (1993) , pp. 3
    • Good, R.J.1
  • 21
    • 0005878813 scopus 로고
    • High Resolution XPS of Organic Polymers, The Scienta ESCA300 Database, John Wiley & Sons, Chichester
    • (1992)
    • Beamson, G.1    Briggs, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.