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Volumn 279, Issue 3, 2001, Pages 214-220
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Surface characterization of atomic oxygen beam-exposed polyimide films using contact angle measurements
b
KOBE UNIVERSITY
(Japan)
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Author keywords
Atomic force microscopy; Atomic oxygen; Contact angle; Polyimide; Surface free energy; X ray photoelectron spectroscopy
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Indexed keywords
ACID;
BASE;
FUNCTIONAL GROUP;
OXYGEN;
POLYIMIDE;
ARTICLE;
ASTRONOMY;
ATOM;
ATOMIC FORCE MICROSCOPY;
CALCULATION;
CONTACT ANGLE;
CONTROLLED STUDY;
ENERGY;
EXPOSURE;
FILM;
HYDROPHILICITY;
MEASUREMENT;
ORBIT;
PARAMETER;
PRIORITY JOURNAL;
SIMULATION;
SPACE;
SURFACE PROPERTY;
TEMPERATURE;
X RAY SPECTROMETRY;
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EID: 0035108493
PISSN: 0303402X
EISSN: None
Source Type: Journal
DOI: 10.1007/s003960000414 Document Type: Article |
Times cited : (30)
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References (27)
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