Crystal structure determination of a series of small organic compounds from powder data

Zeitschrift fur Kristallographie

Volumn 216, Issue 3, 2001, Pages 176-181

  Goubitz, K ^a   Sonneveld, E J ^a   Schenk, H ^a  

^a UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ORGANIC COMPOUND;

ARTICLE; CHEMICAL STRUCTURE; CRYSTAL STRUCTURE; STRUCTURE ANALYSIS; X RAY POWDER DIFFRACTION;

EID: 0035105405     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.216.3.176.20326     Document Type: Article

References (16)

1. Correction for preferred orientation in Rietveld refinement
2. 3D search and research using the Cambridge structural database
3. SIRPOW-92 - A program for automatic solution of crystal structures by direct methods optimized for powder data
4. EXTRA: A programfor extracting structure-factor amplitudes from powder diffraction data
5. 3; a possible model to explain the carcinogenicity of HMPA (= Hexamethylpsphoramide)
6. A grid search procedure of positioning a known molecule in an unknown crystal structure with the use of powder diffraction data
7. Correction of intensities for preferred orientation in powder diffractometry: Application of the March model
8. Crystal structure determination of a series of benzene derivatives from powder data
9. On the determination of accurate intensities from powder diffraction data. I. Whole pattern fitting with a least-squares procedure
10. On the determination of accurate intensities from powder diffraction, data. II. Estimation of intensities of overlapping reflections
11. Application of direct methods to powder data. A weighting scheme for intensities in the optimal symbolic addition program SIMPEL88
12. Application of symmetrized harmonics expansion to correction of the preferred orientation effect
13. 2)Cl
14. Whole-powder-pattern fitting without reference to a structural model: Application to X-ray powder diffractometer data
15. A fully automatic program for finding the unit cell from powder data
16. MRIA - A program for a full profile analysis of powder multiphase neutron-diffraction time-of-flight (direct and Fourier) spectra