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Volumn 55, Issue 1-4, 2001, Pages 125-138

Transmission electron microscopy applied to fluid inclusion investigations

Author keywords

Dislocations; Fluid inclusions; Leakage; Negative crystals; Re equilibration; TEM

Indexed keywords

CRYSTAL STRUCTURE; FLUID INCLUSION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0035101379     PISSN: 00244937     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0024-4937(00)00042-6     Document Type: Article
Times cited : (50)

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  • 14
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.