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Volumn 55, Issue 1-4, 2001, Pages 125-138
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Transmission electron microscopy applied to fluid inclusion investigations
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Author keywords
Dislocations; Fluid inclusions; Leakage; Negative crystals; Re equilibration; TEM
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Indexed keywords
CRYSTAL STRUCTURE;
FLUID INCLUSION;
TRANSMISSION ELECTRON MICROSCOPY;
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EID: 0035101379
PISSN: 00244937
EISSN: None
Source Type: Journal
DOI: 10.1016/S0024-4937(00)00042-6 Document Type: Article |
Times cited : (50)
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References (29)
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