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Volumn 86, Issue 1-2, 2001, Pages 159-164

Electric field gradient tensors at the aluminum sites in the Al2SiO5 polymorphs from CCd high-resolution X-ray diffraction data: Comparison with 27Al NMR results

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ALUMINUM METALLOGRAPHY; CADMIUM COMPOUNDS; CHARGE COUPLED DEVICES; ELECTRIC FIELDS; ELECTRON DENSITY MEASUREMENT; GAMMA RAYS; NUCLEAR MAGNETIC RESONANCE; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; SILICATE MINERALS; SILICON; SINGLE CRYSTALS; TEMPERATURE; TENSORS; X RAY DETECTORS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

EID: 0035090838     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-2001-0117     Document Type: Article
Times cited : (11)

References (24)
  • 20
    • 0005696795 scopus 로고
    • Variance and covariance in experimental electron density studies, and the use of chemical equivalence
    • (1976) Acta Crystallographica , vol.32 A , pp. 483-488
    • Rees, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.