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Volumn 86, Issue 1-2, 2001, Pages 159-164
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Electric field gradient tensors at the aluminum sites in the Al2SiO5 polymorphs from CCd high-resolution X-ray diffraction data: Comparison with 27Al NMR results
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
ALUMINUM METALLOGRAPHY;
CADMIUM COMPOUNDS;
CHARGE COUPLED DEVICES;
ELECTRIC FIELDS;
ELECTRON DENSITY MEASUREMENT;
GAMMA RAYS;
NUCLEAR MAGNETIC RESONANCE;
NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY;
SILICATE MINERALS;
SILICON;
SINGLE CRYSTALS;
TEMPERATURE;
TENSORS;
X RAY DETECTORS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
CHARGE COUPLED DEVICE DETECTORS;
ELECTRIC FIELD GRADIENT TENSORS;
HIGH-RESOLUTION X-RAY DIFFRACTION DATA;
LOW TEMPERATURES;
NUCLEAR QUADRUPOLE COUPLINGS;
QUADRUPOLE COUPLING;
SINGLE CRYSTAL X-RAY DIFFRACTION;
X-RAY DIFFRACTION DATA;
ALUMINUM COMPOUNDS;
ALUMINUM;
ANDALUSITE;
CRYSTAL STRUCTURE;
ELECTRON;
KYANITE;
POLYMORPHISM;
SILLIMANITE;
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EID: 0035090838
PISSN: 0003004X
EISSN: None
Source Type: Journal
DOI: 10.2138/am-2001-0117 Document Type: Article |
Times cited : (11)
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References (24)
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