Effect of diffraction condition on mean free path determination by EELS

Journal of Electron Microscopy

Volumn 50, Issue 1, 2001, Pages 23-28

  Nakafuji, A ^a   Murakami, Y ^a   Shindo, D ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Dynamical diffraction effect; Haematite; Inelastic scattering; Particle; TEM; Thickness determination

Indexed keywords

DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; INELASTIC SCATTERING;

COLLECTION ANGLE; DIFFRACTION CONDITIONS; DYNAMICAL DIFFRACTION EFFECTS; HAEMATITE; HEMATITE PARTICLES; MEAN-FREE PATH; PARTICLE; TEM; THICKNESS DETERMINATION; ZONE AXIS;

HEMATITE;

EID: 0035084931     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/50.1.23     Document Type: Article

References (10)

1. Precise morphological analysis on platelet-type hematite particles by transmission electron microscopy
2. Angular dependence of the characteristic energy loss of electrons passing through metal foils
3. Advantages of a HVEM in electron energy loss spectroscopy
4. Thickness dependence of signal/background ratio of inner-shell electron excitation loss in EELS
5. Measurement of local thickness by electron energy-loss spectroscopy
6. Preparation of monodisperse platelet-type hematite particles from a highly condensed β-FeOOH suspension
7. Electron energy-loss spectroscopy study of angular dependence of B-K edge in h-BN