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Volumn 15, Issue 7, 2001, Pages 462-465
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Electron ionisation induced fragmentation of fused norbornene analogues containing SiMe2 or GeMe2 and oxygen bridges. Migration of SiMe2 and GeMe2 groups
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Author keywords
[No Author keywords available]
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Indexed keywords
GERMANIUM COMPOUNDS;
IONIZATION;
MASS SPECTROMETERS;
OXYGEN;
2-GROUP;
ELECTRON IONIZATION;
FRAGMENTATION PROCESS;
MASS SPECTRA;
NORBORNENES;
OXYGEN BRIDGE;
TANDEM MASS SPECTROMETRIC ANALYSIS;
MASS SPECTROMETRY;
GERMANIUM DERIVATIVE;
NORBORNENE DERIVATIVE;
SILICON DERIVATIVE;
ARTICLE;
CHEMICAL REACTION;
CHEMICAL STRUCTURE;
ELECTRON;
IONIZATION;
MASS SPECTROMETRY;
STRUCTURE ANALYSIS;
TANDEM MASS SPECTROMETRY;
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EID: 0035069650
PISSN: 09514198
EISSN: None
Source Type: Journal
DOI: 10.1002/rcm.256 Document Type: Article |
Times cited : (5)
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References (9)
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