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Journal of Sol-Gel Science and Technology

Volumn 20, Issue 1, 2001, Pages 35-50

X-ray spectroscopic investigation of the Zr-site in thin film Sol-gel surface preparations

(6) Greegor, R B a Blohowiak, K Y a Osborne, J H a Krienke, K A a Cherian, J T a Lytle, F W b

a BOEING COMPANY (United States)

b EXAFS Company (United States)

Author keywords

EXAFS; Sol gel; XANES; XAS; XPS; Zirconium

Indexed keywords

ABSORPTION SPECTROSCOPY; ADHESION; CHEMICAL BONDS; COATINGS; CURING; MIXTURES; SURFACE TREATMENT; THERMAL EFFECTS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROSCOPY; ZIRCONIUM;

AMINOPROPYLTRIETHOXYSILANE; EXTENDED ABSORPTION FINE STRUCTURE; GLYCIDOXYPROPYLTRIMETHOXYSILANE; SOL GEL COATINGS; TETRAPROPOXYZIRCONIUM; THIN FILM SOL-GEL; WATERBORNE MIXTURES; X RAY ABSORPTION NEAR EDGE STRUCTURE; X RAY ABSORPTION SPECTROSCOPY;

SOL-GELS;

EID: 0035067921 PISSN: 09280707 EISSN: None Source Type: Journal
DOI: 10.1023/A:1008772532638 Document Type: Article

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.