Determination of the crystallized fractions of a largely amorphous multiphase material by the Rietveld method

Journal of Applied Crystallography

Volumn 34, Issue 2, 2001, Pages 114-118

  Orlhac, X ^a   Fillet, C ^a   Deniard, P ^b   Dulac, A M ^b   Brec, R ^b  

^a CEA Marcoule   (France)

^b INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

GLASS;

ANALYTIC METHOD; ARTICLE; CRYSTAL; CRYSTALLIZATION; HEAT TREATMENT; THERMOSTABILITY; X RAY POWDER DIFFRACTION;

EID: 0035066846     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800017908     Document Type: Article

References (9)

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4. International Tables for Crystallography (1983). Vol. A. Dordrecht: D. Reidel.
5. Orlhac, X., Fillet, C. & Phalippou, J. (1998). Scientific Basis for Nuclear Waste Management XXII (Boston, USA), Material Research Symposium Proceedings, Vol. 556. In the press.
6. Rietveld, H. M. (1969). J. Appl. Cryst. 2, 65-71.
7. Rodriguez-Carvajal, J. (1993). Physica B, 192, 55-69.
8. Shannon, R. D. & Prewitt, C. T. (1969). Acta Cryst. B25, 925-946.
9. Yasukawa, K., Terashi, Y. & Nakayama, A. (1998). J. Am. Ceram. Soc. 81, 2978-2982.