Shaping the reflection near-field optical probe: Finite domain time difference modelling and fabrication using a focused ion beam

Journal of Microscopy

Volumn 202, Issue 1, 2001, Pages 45-49

  Spajer, M ^a   Parent, G ^a   Bainier, C ^a   Charraut, D ^a  

^a FEMTO ST INSTITUTE   (France)

Author keywords

Optical probes; R SNOM

Indexed keywords

FINITE DIFFERENCE TIME DOMAIN METHOD; ION BEAMS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL FIBERS; PROBES;

B-Y IONS; COLLECTION MODES; DIFFERENCE MODELS; FINITE DOMAINS; FOCUSED IONS BEAMS; NEAR FIELD OPTICAL MICROSCOPY; NEAR-FIELD OPTICAL PROBES; OPTICAL PROBE; R-SNOM; TIME-DIFFERENCES;

NUMERICAL METHODS;

GLASS FIBER; ION;

CONFERENCE PAPER; ELECTROMAGNETIC FIELD; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; OPTICS; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SIGNAL PROCESSING;

EID: 0035063731     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00860.x     Document Type: Conference Paper

References (7)

1. Visualization of latent images by reflection near field optical microscopy
2. Coaxial probes for scanning near-field microscopy
3. Theoretical study of transient phenomena in near-field optics
4. Near-field optical fiber probe optimized for illumination-collection hybrid mode operation
5. The reflection near-field optical microscope: An alternative to STOM
6. High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling