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Volumn 10, Issue 1, 2001, Pages 48-58

UHV μ-electron beam evaluation of the CVD diamond particles grown on Si (001)

Author keywords

CVD; Diamond; Negative electron affinity; Scanning electron microscopy

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CHEMICAL VAPOR DEPOSITION; ELECTRON BEAMS; ELECTRONIC PROPERTIES; FERMI LEVEL; SILICON; SPECTROSCOPY; SPECTRUM ANALYSIS; ULTRAHIGH VACUUM;

EID: 0035063034     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(00)00369-1     Document Type: Article
Times cited : (10)

References (38)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.