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Volumn 10, Issue 1, 2001, Pages 48-58
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UHV μ-electron beam evaluation of the CVD diamond particles grown on Si (001)
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Author keywords
CVD; Diamond; Negative electron affinity; Scanning electron microscopy
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
CHEMICAL VAPOR DEPOSITION;
ELECTRON BEAMS;
ELECTRONIC PROPERTIES;
FERMI LEVEL;
SILICON;
SPECTROSCOPY;
SPECTRUM ANALYSIS;
ULTRAHIGH VACUUM;
PARTICLE GROWTH;
DIAMONDS;
DIAMOND;
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EID: 0035063034
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-9635(00)00369-1 Document Type: Article |
Times cited : (10)
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References (38)
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