Near-field optical microscopy based on microfabricated probes

Journal of Microscopy

Volumn 202, Issue 1, 2001, Pages 7-11

  Eckert, R ^a,d   Freyland, J M ^a   Gersen, H ^a   Heinzelmann, H ^b   Schurmann G ^a   Noell, W ^b   Staufer, U ^c   De Rooij, N F ^b  

^a CSEM   (Switzerland)

^b UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^c UNIVERSITY OF BASEL   (Switzerland)

^d UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Fluorescence microscopy; Microfabricated cantilevers; NSOM; Optical near field; Single molecule; SNOM

Indexed keywords

FLUORESCENCE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MICROFABRICATION; MOLECULES; NANOCANTILEVERS; PROBES;

CANTILEVER PROBE; HIGH-RESOLUTION IMAGING; LATEX BEADS; MICROFABRICATED; MICROFABRICATED CANTILEVERS; MICROFABRICATED PROBES; NEAR FIELD OPTICAL MICROSCOPY; OPTICAL NEAR FIELD; SINGLE MOLECULE; THICK LAYERS;

FLUORESCENCE MICROSCOPY;

ALUMINUM; SILICON DIOXIDE;

CONFERENCE PAPER; FLUORESCENCE; IMAGE ANALYSIS; OPTICAL RESOLUTION; OPTICS; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0035060417     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00880.x     Document Type: Conference Paper

References (10)

1. Near-field optics: Microscopy, spectroscopy, and surface modification beyond the diffraction limit
2. Faraday-rotation imaging by near-field optical microscopy
3. Contrast enhancement using polarization-modulation scanning near-field optical microscopy (PM-SNOM)
4. Novel optical approach to atomic force microscopy
5. Microfabrication of new sensors for scanning probe microscopy
6. High-quality near-field optical probes by tube etching
7. High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling
8. Single molecule mapping of the optical field distribution of probes for near-field microscopy
9. Modified fabrication process for aperture probe cantilevers
10. Generic scanned-probe microscope sensors by combined micromachining and electron-beam lithography