Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors

Journal of Electronic Imaging

Volumn 10, Issue 1, 2001, Pages 228-233

  Krüger, Sven ^a   Wernicke, Günther ^a   Osten, Wolfgang ^b   Kayser, Daniel ^b   Demoli, Nazif ^c   Gruber, Hartmut ^a  

^a HUMBOLDT UNIVERSITY   (Germany)

^b BIAS BREMER INSTITUT FÜR ANGEWANDTE STRAHLTECHNIK GMBH   (Germany)

^c UNIVERSITY OF ZAGREB   (Croatia)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT DETECTION; INTERFEROMETRIC FRINGE PATTERNS;

FAILURE ANALYSIS; FUNCTIONS; IMAGE QUALITY; INTERFEROMETRY; NONDESTRUCTIVE EXAMINATION; SIGNAL DETECTION; WAVELET TRANSFORMS;

FEATURE EXTRACTION;

EID: 0035059954     PISSN: 10179909     EISSN: 1560229X     Source Type: Journal    
DOI: 10.1117/1.1318908     Document Type: Article

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