Large signal dielectric characterization measurement for integrated passive devices

Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Volumn 2, Issue , 2001, Pages 1203-1209

  Chen, R ^a   Strydom, J T ^a   Zhao, L ^a   Van Wyk, J D ^a  

^a State University   (United States)

Author keywords

High power laboratory; HVDC; Operational tests; Synthetic test circuit; Thyristor modules; Type testing

Indexed keywords

DIELECTRIC LOSSES; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; MAGNETIC HYSTERESIS; PASSIVE NETWORKS; PERMITTIVITY; POWER ELECTRONICS;

INTEGRATED PASSIVE DEVICES; LARGE SIGNAL DIELECTRIC CHARACTERIZATION;

CAPACITORS;

EID: 0035058047     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. Capacitor measurements for power electronics applications
2. 3 nonlinear ceramic disc capacitors for high-voltage applications
3. Studies of non-linear capacitors for application in snubbermodules for power electronic switches
4. Some limits of integrated LCT modules for resonant converters at 1 MHz