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Materials Research Bulletin

Volumn 36, Issue 1-2, 2001, Pages 161-170

Fabrication and characterization of nanocrystalline cobalt oxide thin films

(4) Pejova, Biljana a Isahi, Ardijana a Najdoski, Metodija a Grozdanov, Ivan a

a SS CYRIL AND METHODIUS UNIVERSITY (Macedonia)

Author keywords

A. Oxides; A. Semiconductors; A. Thin films; B. Crystal growth; C. X ray diffraction

Indexed keywords

ANNEALING; COBALT COMPOUNDS; ELECTRIC CONDUCTIVITY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT ABSORPTION; NANOSTRUCTURED MATERIALS; SEMICONDUCTING GLASS; SUBSTRATES; SYNTHESIS (CHEMICAL); THIN FILMS; X RAY DIFFRACTION ANALYSIS;

COBALT OXIDES;

SEMICONDUCTING FILMS;

EID: 0035050930 PISSN: 00255408 EISSN: None Source Type: Journal
DOI: 10.1016/S0025-5408(00)00479-7 Document Type: Article

Times cited : (139)

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