Characteristics of (Pb1-xSrx)TiO3 thin film prepared by a chemical solution processing

Materials Research Bulletin

Volumn 36, Issue 1-2, 2001, Pages 265-276

  Kang, Dong Heon ^a   Kim, Ji Hun ^a   Park, Jeong Hwan ^b   Yoon, Ki Hyun ^b  

^a Suwon University   (South Korea)

^b Yonsei University   (South Korea)

Author keywords

A. Oxides; A. Thin films; B. Sol gel chemistry; D. Dielectric properties

Indexed keywords

ANNEALING; BOUNDARY CONDITIONS; CHELATION; CURRENT DENSITY; FILM PREPARATION; INTERFACES (MATERIALS); LEAD COMPOUNDS; LEAKAGE CURRENTS; MULTILAYERS; PERMITTIVITY; PEROVSKITE; PHASE TRANSITIONS; SOL-GELS; SUBSTITUTION REACTIONS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

DEIONIZED WATER; MULTILAYER ANNEALING;

FERROELECTRIC THIN FILMS;

EID: 0035050649     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(01)00511-6     Document Type: Article

References (27)