Characterization of the focal quality of micron size beams from x-ray mirrors and zone plates

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4145, Issue , 2001, Pages 16-21

  Thompson, A C ^a   Underwood, J H ^a   Anderson, E H ^a   McHugo, S A ^a   Lai, B ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Flare from x ray optics; X ray mirror; X ray optics; X ray zone plate

Indexed keywords

ABSORPTION SPECTROSCOPY; CALCULATIONS; CHARACTERIZATION; FABRICATION; MIRRORS; SILICON WAFERS; X RAY SPECTROSCOPY;

FLARE FROM X RAY OPTICS; FULL WIDTH HALF MAXIMUM; MICRON SIZE BEAM; X RAY MIRROR; X RAY ZONE PLATE;

X RAY OPTICS;

EID: 0035047275     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.411640     Document Type: Article

References (2)

1. Nanometer focusing of hard X-rays by phase zone plates