Voltage clamp limitations of dual whole-cell gap junction current and voltage recordings. I. Conductance measurements

Biophysical Journal

Volumn 80, Issue 5, 2001, Pages 2231-2247

  Veenstra, Richard D ^a  

^a State University of New York Upstate Medical University: College of Medicine   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; ARTICLE; CELL MEMBRANE POTENTIAL; CHANNEL GATING; GAP JUNCTION; MEMBRANE CONDUCTANCE; MEMBRANE MODEL; PREDICTION;

EID: 0035038838     PISSN: 00063495     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0006-3495(01)76196-6     Document Type: Article

References (1)

1. Barrio, L. C., T. M. Suchyna, T. Bargiello, L. X. Xu, R. S. Roginski, M. V. L. Bennett, and B. J. Nicholson. 1991. Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage. Proc. Natl. Acad. Sci. U.S.A. 88:8410-8414.