ESR investigation of ferroelectric films

Integrated Ferroelectrics

Volumn 32, Issue 1-4, 2001, Pages 159-167

  Bykov, I P ^a   Glinchuk, M D ^a   Laguta, V V ^a   Slipenyuk, A M ^a   Soukup, L ^a   Jastrabik, L ^a   Hrabovsky, M ^a  

^a FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

Author keywords

ESR method; Surface center; Thick film; Thin film

Indexed keywords

ALUMINA; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; DOPING (ADDITIVES); ELECTRON SPIN RESONANCE SPECTROSCOPY; LEAD COMPOUNDS; MAGNESIA; MAGNETIC FIELD EFFECTS; SINGLE CRYSTALS; STRONTIUM COMPOUNDS; THICKNESS MEASUREMENT;

LEAD TITANATE; STRONTIUM TITANATE; SURFACE CENTER;

FERROELECTRIC THIN FILMS;

EID: 0035031671     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584580108215687     Document Type: Conference Paper

References (17)