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Materials Science Forum

Volumn 363-365, Issue , 2001, Pages 167-169

Positron annihilation study of microvoids in neutron-irradiated vanadium: Effects of oxygen impurities

(4) Riewcharoon, T a Tang, Z a Nagai, Y b Hasegawa, M a,b

a TOHOKU UNIVERSITY (Japan)

b TOHOKU UNIVERSITY (Japan)

Author keywords

Coincidence Doppler broadening; Microvoids; Positron annihilation; Vanadium

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL IMPURITIES; ELECTRON TRAPS; NEUTRON IRRADIATION; OXYGEN; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS;

COINCIDENCE DOPPLER BROADENING; IRRADIATION INDUCED DEFECTS; MICROVOIDS; NEUTRON IRRADIATED VANADIUM; OXYGEN IMPURITIES; POSITRON LIFETIME;

VANADIUM;

EID: 0035024541 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.363-365.167 Document Type: Conference Paper

Times cited : (5)

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