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Volumn , Issue , 2001, Pages 379-385

A new approach to the robust wirebonding

(1)  Pham, C V a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; KINETIC ENERGY; MICROPROCESSOR CHIPS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON; SHRINKAGE; THERMAL DIFFUSION;

EID: 0035019042     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (3)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.