Characterization of radiation-induced defects in ZnO probed by positron annihilation spectroscopy

Materials Science Forum

Volumn 363-365, Issue , 2001, Pages 141-143

  Brunner, S ^a   Puff, W ^a   Balogh, A G ^b   Mascher, Peter ^c  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^c MCMASTER UNIVERSITY   (Canada)

Author keywords

Irradiation; Isochronal annealing; ZnO

Indexed keywords

ANNEALING; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; DOPPLER EFFECT; ELECTRON IRRADIATION; POSITRON ANNIHILATION SPECTROSCOPY; PROTON IRRADIATION; RADIATION DAMAGE; SINGLE CRYSTALS;

DOPPLER BROADENING MEASUREMENTS; ISOCHRONAL ANNEALING; POSITRON LIFETIME; RADIATION INDUCED DEFECTS; THERMAL EVOLUTION;

ZINC OXIDE;

EID: 0035017731     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.363-365.141     Document Type: Conference Paper

References (6)

1. W. Puff, Comput. Phys. Commun., 30 (1983), p. 359.
2. S. Brunner, W. Puff, P. Mascher, and A. G. Balogh, "Microstructural Evolution of Radiation Induced Defects in ZnO during Isochronal Annealing", Mat. Res. Soc. Symp. Proc., Vol. 540, pp. 207-212, 1999.
3. R. N. West, Adv. Phys., 22 (1973), p. 263.
4. D. C. Look, D. C. Reynolds, J. W. Hemsky, R. L. Jones, and J. R. Sizelove, Appl. Phys. Lett., 75 (1999), p. 811.
5. P. Mascher, S. Dannefaer, and D. Kerr, Phys. Rev. B, 40 (1989), p. 11764.
6. F. Plazaola, (2000), priv. communications.