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Volumn 167, Issue , 2001, Pages 89-100

Surface structure of amorphous PMMA from SPM: Auto-correlation function and fractal analysis

Author keywords

[No Author keywords available]

Indexed keywords

CONFERENCE PAPER; CONFORMATIONAL TRANSITION; CORRELATION FUNCTION; FRACTAL ANALYSIS; PHASE TRANSITION; SCANNING PROBE MICROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY; X RAY DIFFRACTION;

EID: 0035017303     PISSN: 10221360     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3900(200103)167:1<89::AID-MASY89>3.0.CO;2-S     Document Type: Article
Times cited : (14)

References (14)
  • 4
    • 0002504317 scopus 로고    scopus 로고
    • Scanning probe microscopy of polymers
    • ACS, Washington, DC
    • Scanning Probe Microscopy of Polymers, B.D.Ratner, V.V.Tsukruk (Eds), ACS Symposium Seies 694, ACS, Washington, DC 1998
    • (1998) ACS Symposium Seies 694
    • Ratner, B.D.1    Tsukruk, V.V.2
  • 7
    • 0346785669 scopus 로고    scopus 로고
    • Organic thin films: Structure and applications
    • C. W. Frank (Ed.), Oxford University Press
    • V.N.Bliznyuk, A.Campbell, V.V.Tsukruk in: Organic Thin Films: Structure and Applications, C. W. Frank (Ed.), ACS Symposium Series 695, Oxford University Press 1998, p.220
    • (1998) ACS Symposium Series 695 , pp. 220
    • Bliznyuk, V.N.1    Campbell, A.2    Tsukruk, V.V.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.