Transmission electron microscopical studies of the layered structure of the ternary semiconductor CuIn5Se8

Crystal Research and Technology

Volumn 36, Issue 3, 2001, Pages 303-308

  Tham, A T ^a   Su, D S ^b   Neumann, W ^a   Schubert Bischoff, P ^c   Beilharz, C ^d   Benz, K W ^d  

^a HUMBOLDT UNIVERSITY   (Germany)

^b FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^c HAHN MEITNER INSTITUT   (Germany)

^d UNIVERSITY OF FREIBURG   (Germany)

Author keywords

CuInSe; Layer; TEM

Indexed keywords

ELECTRON DIFFRACTION; HIGH RESOLUTION ELECTRON MICROSCOPY; PHASE DIAGRAMS; SEMICONDUCTING INDIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

CUBIC STACKING; HEXAGONAL STACKING; LAYERED STRUCTURE; TERNARY PHASE DIAGRAM; VERTICAL GRADIENT FREEZE METHOD;

CRYSTAL STRUCTURE;

EID: 0035014331     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4079(200103)36:3<303::AID-CRAT303>3.0.CO;2-X     Document Type: Article

References (9)

1. BEILHARZ, C.: Ph. D. Thesis, University of Freiburg (1998).
2. BLOSS, W. H., PFISTERER, F., SCHUBERT, M., AND WALTER, T.: Progress in Photovoltaics: Research and Applications, 3, 3-24 (1995).
3. FRANGIS, N., VAN TEDELOO, G., MANOLIKAS, C., VAN LANDUYT, J., AND AMELINCKX, S.: Phys. Stat. Sol. (a), 96, 53-65 (1986).
4. MANOLIKAS, C., VAN LANDUYT, J., DE RIDDER, R., AND AMELINCKX, S.: Phys. Stat. Sol. (a), 55, 709-722 (1979).
5. SU, D. S., THAM, A.-T., SCHUBERT-BISCHOFF, P., ZEITLER E., AND NEUMANN W.: Proc. IV., Multinat. Cong. Electr. Microsc., (Ed.) K. Kovács, 367-368 (1999).
6. THAM, A.-T.: Diploma thesis, Humboldt University of Berlin (1999).
7. TSENG, B. H. AND WERT, C. A.: J. Appl. Phys., 65 (6), 2254-2257 (1989).
8. WEI, S. H., ZHANG, S. B., AND ZUNGER, A: Inst. Phys. Conf. Ser. No. 152, 765-771 (1998).
9. ZHANG, S. B., WIE, S. H., AND ZUNGER, A: Phys. Rev. Lett. 78-(21), 4059-4062 (1997).