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Volumn 4189, Issue , 2001, Pages 239-247

Calibration methods for 3D measurement systems

Author keywords

3D; Error analysis; Structured light

Indexed keywords

ABERRATIONS; CALIBRATION; ERROR ANALYSIS; LASER APPLICATIONS; REFLECTION; THREE DIMENSIONAL;

EID: 0035011359     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.417199     Document Type: Article
Times cited : (10)

References (9)
  • 1
  • 8
    • 0033352285 scopus 로고    scopus 로고
    • Sine wave artifact as a means of calibrating structured light systems
    • Harding
    • (1999) SPIE , vol.3835 , pp. 192-202
    • Harding, K.G.1
  • 9
    • 0029770375 scopus 로고
    • 3D laser measurements on scattering and translucent surfaces
    • Three-dimensional and Unconventional Imaging for Industrial Inspection and Metrology, editor Harding, Phil. Oct
    • (1995) SPIE Proceedings , vol.2599
    • Harding, K.G.1    Svetkoff, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.