SEM CL in-situ observation during dislocation motion in GaAs and CdTe

Solid State Phenomena

Volumn 78-79, Issue , 2001, Pages 139-148

  Hoering, L ^a   Schreiber, J ^a   Hilpert, U ^a  

^a FG EPV   (Germany)

Author keywords

Defect configuration; Dynamic; In situ; Local deformation; REDG

Indexed keywords

CATHODOLUMINESCENCE; CRYSTAL LATTICES; CRYSTALLINE MATERIALS; ELECTRON IRRADIATION; NUCLEATION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING GALLIUM ARSENIDE; SURFACES;

CRYSTALLINE SEMICONDUCTOR; POLAR GLIDE DISLOCATION; RECOMBINATION ENHANCED DISLOCATION GLIDE;

DISLOCATIONS (CRYSTALS);

EID: 0035010603     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/ssp.78-79.139     Document Type: Conference Paper

References (12)