Dirichlet Binomial Attribute Testing model: A Bayesian approach to estimating reliability decay

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 2001, Pages 393-400

  Patterson, Jonathan L ^a   Dietrich, Duane ^b  

^a Canadian National Defence   (Canada)

^b University of Arizona   (United States)

Author keywords

Attribute testing; Dirichlet distribution; Ordered reliability; Reliability aging; Reliability decay

Indexed keywords

AGING OF MATERIALS; COMPUTER SIMULATION; FAILURE (MECHANICAL); MATERIALS TESTING; MATHEMATICAL MODELS;

DIRICHLET-BINOMIAL ATTRIBUTE TESTING (DBAT); RELIABILITY DECAY;

RELIABILITY THEORY;

EID: 0035010305     PISSN: 0149144X     EISSN: None     Source Type: Journal    
DOI: 10.1109/RAMS.2001.902498     Document Type: Article

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