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Volumn , Issue , 2001, Pages 479-482
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Effect of fringing capacitances in sub 100 nm MOSFET's with high-k gate dielectrics
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
DEGRADATION;
DIELECTRIC MATERIALS;
HOT CARRIERS;
LEAKAGE CURRENTS;
MONTE CARLO METHODS;
MOS CAPACITORS;
GATE DIELECTRICS;
MOSFET DEVICES;
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EID: 0035006656
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (9)
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References (5)
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