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Volumn , Issue , 2001, Pages 479-482

Effect of fringing capacitances in sub 100 nm MOSFET's with high-k gate dielectrics

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DEGRADATION; DIELECTRIC MATERIALS; HOT CARRIERS; LEAKAGE CURRENTS; MONTE CARLO METHODS; MOS CAPACITORS;

EID: 0035006656     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (5)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.