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Volumn 1, Issue , 2001, Pages 468-471

Error analysis for time-interleaved analog channels

Author keywords

[No Author keywords available]

Indexed keywords

COMBINED CHANNELS; DIGITAL SIGNALS; GAIN AND OFFSET; HIGH-SPEED DATA CONVERTERS; PROCESSING CHANNELS; SIGNALTONOISE RATIO (SNR); TIME-INTERLEAVED; TIME-INTERLEAVED ARCHITECTURE;

EID: 0034995983     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2001.921894     Document Type: Conference Paper
Times cited : (13)

References (9)
  • 1
    • 0031073056 scopus 로고    scopus 로고
    • A 4b 8Gsample/s A/D converter in SiGe bipolar technology
    • Feb.
    • Xiao. P. et al. "A 4b 8Gsample/s A/D converter in SiGe bipolar technology". ISSCC Digest of Technical papers, pp. 124-125. Feb. 1997
    • (1997) ISSCC Digest of Technical Papers , pp. 124-125
    • Xiao, P.1
  • 4
    • 0019265826 scopus 로고
    • Time interleaved converter arrays
    • 962-970, Dec
    • William C. Black. Jr. David A. Hodges, "Time Interleaved Converter Arrays", IEEE Journal of Solid State Circuits, Vol. SC-15. no. 6, pp. 1022-1029. pp. 962-970. Dec. 1980
    • (1980) IEEE Journal of Solid State Circuits , vol.SC-15 , Issue.6 , pp. 1022-1029
    • Black Jr., W.C.1    Hodges, D.A.2
  • 6
    • 0032313025 scopus 로고    scopus 로고
    • A digital background calibration technique for time-interleaved analog-to-digital converters
    • Dec.
    • Daihong Fu. et al.", A Digital Background Calibration Technique for Time-Interleaved Analog-to-Digital Converters". IEEE Journal of Solid-State Circuits. Vol. 33. no. 12, pp 1904-1911. Dec. 1998
    • (1998) IEEE Journal of Solid-state Circuits , vol.33 , Issue.12 , pp. 1904-1911
    • Fu, D.1
  • 8
    • 0024018237 scopus 로고
    • Digital spectra of nonuniformly sampled signals: Fundamentals and high speed waveform digitizers
    • Feb.
    • Jenq. Y. C. " Digital spectra of nonuniformly sampled signals: Fundamentals and high speed waveform digitizers", IEEE Transactions on Instrumentation and measurement. Vol. 39, No. 1. Feb. pp. 245-251. 1990
    • (1990) IEEE Transactions on Instrumentation and Measurement , vol.39 , Issue.1 , pp. 245-251
    • Jenq, Y.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.