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Volumn 48, Issue 6, 2001, Pages 670-683
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Estimating the posterior probability of LTP failure by sequential bayesian analysis of an imperfect Bernoulli trial model
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Author keywords
Bayes factor; Bayesian statistics; Bernoulli trials; Beta distribution; Excitatory postsynaptic current (EPSC); Long term; Marginalized likelihood function; Noninformative prior density; Posterior distribution
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Indexed keywords
ALGORITHMS;
ELECTRIC EXCITATION;
MATHEMATICAL MODELS;
NEUROPHYSIOLOGY;
VOLTAGE MEASUREMENT;
TETANICALLY STIMULATED (TS) NEURONS;
BIOELECTRIC POTENTIALS;
ARTICLE;
BAYES THEOREM;
EXCITATORY POSTSYNAPTIC POTENTIAL;
INFORMATION PROCESSING;
LONG TERM POTENTIATION;
VOLTAGE CLAMP;
ALGORITHMS;
BAYES THEOREM;
BIOPHYSICS;
EXCITATORY POSTSYNAPTIC POTENTIALS;
HUMANS;
LIKELIHOOD FUNCTIONS;
LONG-TERM POTENTIATION;
MODELS, NEUROLOGICAL;
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EID: 0034993859
PISSN: 00189294
EISSN: None
Source Type: Journal
DOI: 10.1109/10.923785 Document Type: Article |
Times cited : (1)
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References (12)
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