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Materials Transactions

Volumn 42, Issue 1, 2001, Pages 128-131

Application of a fractal method to quantitatively describe some typical fracture surfaces

(4) Li, X W a Tian, J F a Li, S X a Wang, Z G a

a INSTITUTE OF METAL RESEARCH (China)

Author keywords

Fractal dimension; Fracture surface; Quantitative measurement; Secondary electron line scanning; Vertical sectioning

Indexed keywords

DISLOCATIONS (CRYSTALS); FATIGUE OF MATERIALS; FRACTALS; FRACTURE; GRAIN BOUNDARIES; MICROSTRUCTURE;

SECONDARY ELECTRON LINE SCANNING METHOD (SELSM); VERTICAL SECTIONING METHOD (VSM);

COMPOSITE MATERIALS;

EID: 0034986770 PISSN: 13459678 EISSN: None Source Type: Journal
DOI: 10.2320/matertrans.42.128 Document Type: Article

Times cited : (13)

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