Observation of negative-ion-implanted polystyrene by atomic force microscope for improvement of neural attachment properties

Shinku/Journal of the Vacuum Society of Japan

Volumn 44, Issue 3, 2001, Pages 217-220

  Sasaki, H ^a   Tsuji, H ^a   Sato, H ^a   Gotoh, Y ^a   Ishikawa, J ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ION BEAMS; ION IMPLANTATION; MORPHOLOGY; NUMERICAL METHODS; SURFACE ROUGHNESS; SURFACES;

NEURAL ATTACHMENT PROPERTIES; SURFACE HYDROPHYLICITY;

POLYSTYRENES;

EID: 0034975938     PISSN: 05598516     EISSN: None     Source Type: Journal    
DOI: 10.3131/jvsj.44.217     Document Type: Article

References (12)