Development of a high-pressure xenon ionization chamber gamma-ray spectrometer for field deployment in cone penetrometers

Journal of Radioanalytical and Nuclear Chemistry

Volumn 248, Issue 2, 2001, Pages 289-294

  Palmer, R L ^a,c   Tepper, G C ^b,c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Virginia Commonwealth University   (United States)

^c Sentor Technologies Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

XENON;

CONFERENCE PAPER; CONTAMINATION; GAMMA RADIATION; GAMMA SPECTROMETRY; IONIZATION CHAMBER; RADIATION DETECTION; SCINTISCANNING;

EID: 0034971813     PISSN: 02365731     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1010647118285     Document Type: Conference Paper

References (8)