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Volumn 39, Issue 10, 2001, Pages 1575-1587

Surface characterization of submicron vapor grown carbon fibers by scanning tunneling microscopy

Author keywords

A. Carbon fibers; C. Scanning tunneling microscopy (STM); Scanning electron microscopy (SEM); Vapor grown carbon; X ray diffraction

Indexed keywords

GAS ADSORPTION; NANOSTRUCTURED MATERIALS; NITROGEN; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SURFACE TOPOGRAPHY; VAPORS; X RAY DIFFRACTION ANALYSIS;

EID: 0034953677     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0008-6223(00)00286-4     Document Type: Article
Times cited : (21)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.