SLM operating curves for statistical pattern recognition metrics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4387, Issue , 2001, Pages 27-40

  Juday, Richard D ^a   Michael Rollins, J Michael ^b   Monroe, Stanley E ^c  

^a NASA JOHNSON SPACE CENTER   (United States)

^b Hernandez Engineering   (United States)

^c Lockheed Martin Engineering and Science   (United States)

Author keywords

Optical correlator; Optical pattern recognition; Optimal filters

Indexed keywords

LIGHT MODULATORS; OPTICAL CORRELATION; OPTICAL FILTERS; SIGNAL TO NOISE RATIO;

SPATIAL LIGHT MODULATORS (GLM);

PATTERN RECOGNITION;

EID: 0034939909     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.421149     Document Type: Article

References (7)

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7. Log polar dappled target