|
|
Volumn 65, Issue 5, 2001, Pages 397-403
|
|
Characterization of crater microstructure on galvannealed steels by focused ion beam fabrication with extraction technique of micro-scaled samples
a
a
|
|
Author keywords
Crater; Focused ion bean method; Galvannealed reaction process; Galvannealed steel; Interface segregation; Micro sampling; phase; phase
|
|
Indexed keywords
ANNEALING;
CORROSION RESISTANCE;
ELECTRON GUNS;
ENERGY DISPERSIVE SPECTROSCOPY;
GALVANIZED METAL;
GALVANIZING;
GRAIN BOUNDARIES;
ION BEAMS;
METALLOGRAPHIC MICROSTRUCTURE;
OXIDATION;
SEGREGATION (METALLOGRAPHY);
TRANSMISSION ELECTRON MICROSCOPY;
CRATER MICROSTRUCTURE;
FOCUSED ION BEAM FABRICATION METHOD;
GALVANNEALED STEEL;
INTERFACE SEGREGATION;
MICROSAMPLING TECHNIQUE;
SCANNING ION MICROGRAPHS;
STEEL;
|
|
EID: 0034939449
PISSN: 00214876
EISSN: None
Source Type: Journal
DOI: 10.2320/jinstmet1952.65.5_397 Document Type: Article |
|
Times cited : (14)
|
|
References (10)
|
