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Volumn 4349, Issue , 2001, Pages 86-89
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Strategies for wafer-scale hot embossing lithography
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
FILLING;
FLOW INTERACTIONS;
MASKS;
POLYMERS;
STAMPING;
VISCOELASTICITY;
WSI CIRCUITS;
HOT EMBOSSING LITHOGRAPHY (HEL);
LITHOGRAPHY;
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EID: 0034934639
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.425080 Document Type: Conference Paper |
Times cited : (11)
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References (7)
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