-
3
-
-
33749111990
-
Documents concerning the new definition of the metre
-
(1984)
Metrologia
, vol.19
, pp. 163-177
-
-
-
10
-
-
18844420477
-
Mise en pratique of the definition of the metre (1992)
-
(1993)
Metrologia
, vol.30
, pp. 523-541
-
-
Quinn, T.J.1
-
15
-
-
0001975295
-
2 laser
-
(1993)
Opt. Commun.
, vol.97
, pp. 29-34
-
-
Acef, O.1
Zondy, J.-J.2
Abed, M.3
Rovera, G.G.4
Gérard, A.H.5
Clairon, A.6
Laurent, Ph.7
Millerioux, Y.8
Juncar, J.9
-
17
-
-
0034292584
-
Accuracy comparison of optical frequency measurement between harmonic-generation synthesis and a frequency division femtosecond-comb, accepted for publication
-
(2000)
Phys. Rev. Lett.
, vol.85
, pp. 3797-3800
-
-
Ye, J.1
Yoon, T.H.2
Hall, J.L.3
Madej, A.4
Bernard, J.E.5
Klaus, J.6
Siemsen, J.7
Marmet, L.8
Chartier, J.-M.9
Chartier, A.10
-
28
-
-
0020101503
-
Results of international comparisons using methanestabilized He-Ne lasers at 3.39 μm and iodine stabilized He-Ne lasers at 633 nm
-
(1983)
IEEE Trans. Instrum. Meas.
, vol.IM-32
, pp. 81-83
-
-
Chartier, J.-M.1
-
29
-
-
0000479149
-
2-Stabilized He-Ne lasers at 633 nm wavelength of the National Research Laboratory of Metrology of Japan and the Bureau International des Poids et Mesures
-
(1989)
Metrologia
, vol.26
, pp. 257-261
-
-
Iwasaki, S.1
Chartier, J.-M.2
-
30
-
-
0026107484
-
International comparison of iodine-stabilized helium-neon lasers at λ = 633 nm involving seven laboratories
-
(1991)
Metrologia
, vol.28
, pp. 19-25
-
-
Chartier, J.-M.1
Robertsson, L.2
Sommer, M.3
Tschirnich, J.4
Navratil, V.5
Gata, R.6
Pucek, B.7
Blabla, J.8
Smydke, J.9
Ziegler, M.10
Zeleny, V.11
Petru, F.12
Vesela, Z.13
Tomanyczka, K.14
Banreti, E.15
Zakharenko, Yu.G.16
Vitushkin, L.F.17
-
32
-
-
0000427004
-
Results of recent international comparisons of national measurement standards carried out by the BIPM
-
(1996)
Metrologia
, vol.33
, pp. 271-287
-
-
Quinn, T.J.1
-
38
-
-
0031343319
-
2 stabilized He-Ne lasers at λ ≈ 633 nm
-
(1997)
Metrologia
, vol.34
, pp. 301-307
-
-
Stahlberg, B.1
Ikonen, E.2
Haldin, J.3
Hu, J.4
Ahola, T.5
Riski, K.6
Pendrill, L.7
Karn, U.8
Henningsen, J.9
Simonsen, H.10
Chartier, A.11
Chartier, J.-M.12
-
40
-
-
0032256490
-
2 stabilized He-Ne laser at λ ≈ 633 nm
-
July 1993 to September 1995
-
(1998)
Metrologia
, vol.35
, pp. 799-806
-
-
Navratil, V.1
Fodrekova, A.2
Gàta, R.3
Blabla, J.4
Balling, P.5
Ziegler, M.6
Zelevy, V.7
Petrû, F.8
Lazar, J.9
Veselá, Z.10
Gliwa-Gliwinski, J.11
Walczuk, J.12
Bánréti, E.13
Tomanyiczka, K.14
Chartier, A.15
Chartier, J.-M.16
-
41
-
-
0033328851
-
2 at λ ≈ 633 nm Part IV: Comparison of western European lasers at λ ≈ 633 nm
-
July 1993 to September 1995
-
(1999)
Metrologia
, vol.36
, pp. 199-206
-
-
Darnedde, H.1
Rowley, W.R.C.2
Bertinetto, F.3
Millerioux, Y.4
Haitjema, H.5
Wetzels, S.6
Pirie, H.7
Prieto, E.8
Mar Perez, M.9
Vaucher, B.10
Chartier, A.11
Chartier, J.-M.12
-
42
-
-
0033717775
-
2 at λ ≈ 633 nm, Part V: Comparison of Asia-Pacific and South Africa, atλ ≈ 633 nm
-
July 1993 to September 1995
-
(2000)
Metrologia
, vol.37
, pp. 107-113
-
-
Brown, N.1
Jaatinen, E.2
Suh, H.3
Howick, E.4
Xu, G.5
Veldman, I.6
Chartier, A.7
Chartier, J.-M.8
-
43
-
-
0033720988
-
2 atλ ≈ 633 nm ), Part VI: Comparison of Noramet at λ ≈ 633 nm
-
July 1993 to September 1995
-
(2000)
Metrologia
, vol.37
, pp. 115-120
-
-
Abramova, L.1
Zakharenko, Yu.2
Fedorine, V.3
Blajev, T.4
Kartaleva, S.5
Karlson, H.6
Popescu, Gh.7
Chartier, A.8
Chartier, J.M.9
-
44
-
-
0034505631
-
2 Stabilized He-Ne Lasers at λ ≈ 633 nm
-
March 1997
-
(2000)
Metrologia
, vol.37
, pp. 269-274
-
-
Viliesid, M.1
Gutierrez-Mungia, M.2
Galvan, C.A.3
Castillo, H.A.4
Madej, A.5
Hall, J.L.6
Stone, J.7
Chartier, A.8
Chartier, J.M.9
-
45
-
-
17744366358
-
2 at λ 633 nm
-
Use of the Fifth or the Third Harmonic-locking Technique Compared, to be published
-
(2000)
Metrologia
, vol.37
-
-
Lassila, A.1
Riski, K.2
Hu, J.3
Ahola, T.4
Naicheng, S.5
Chenyang, L.6
Bailing, P.7
Blabla, J.8
Abramova, L.9
Zakharenko, Yu.G.10
Fedorin, V.L.11
Chartier, A.12
Chartier, J.-M.13
-
46
-
-
17844387635
-
2 at λ ≈ 633 nm ), Part VIII: Comparison of NIM (China), NRLM(Japon), KRISS (Rep. Of Korea) and BIPM lasers at λ ≈ 633 nm
-
July 1997
-
(2001)
Metrologia
, vol.38
-
-
Shaoxi, S.1
Yucai, N.2
Jin, Q.3
Zhangyou, L.4
Chunying, S.5
Gialuan, A.6
Lanxiang, W.7
Iawasaki, S.8
Ishikawa, I.9
Hong, F.-L.10
Such, H.S.11
Labot, J.12
Chartier, A.13
Chartier, J.-M.14
-
47
-
-
0004600120
-
-
Mutual recognition of national measurement standards and calibration certificates issued by national metrology institutes
-
(1999)
-
-
Quinn, T.J.1
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