Inversion of dynamical electron scattering to obtain the crystal potential using data from two thicknesses

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 57, Issue 4, 2001, Pages 473-474

  Allen, L J ^a   Koch, C ^b   Oxley, M P ^a   Spence, J C H ^b  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CRYSTAL STRUCTURE; DATA ANALYSIS; ELECTRON DIFFRACTION; MATHEMATICAL ANALYSIS; WAVEFORM;

EID: 0034931031     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767301006353     Document Type: Article

References (10)

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3. Allen, L. J., Josefsson, T. W. & Leeb, H. (1998). Acta Cryst. A54, 388-398.
4. Allen, L. J., Leeb, H. & Spargo, A. E. C. (1999). Acta Cryst. A55, 105-111.
5. Chen, F.-R., Kai, J. J., Chang, L., Wang, J. Y. & Chen, W. J. (1999). J. Electron Microsc. 48, 827-836.
6. Rez, P. (1999). Acta Cryst. A55, 160-167.
7. Smith, D. (1997). Rep. Prog. Phys. 60, 1513-1580.
8. Spence, J. C. H. (1998). Acta Cryst. A54, 7-18.
9. Spiegel, M. R. (1968). Mathematical Handbook, p. 176. New York: McGraw-Hill.
10. Williams, D. B. & Carter, C. B. (1996). Transmission Electron Microscopy. A Textbook for Materials Science, pp. 321-323. New York: Plenum Press.