The modified integral method and real electromagnetic properties of echelles

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4291, Issue , 2001, Pages 13-24

  Goray, L I ^a  

^a Intl Intellectual Group Inc   (United States)

Author keywords

Diffraction grating; Echelle; Echelle grating; Efficiency modeling; Electromagnetic theory; Integral method; PCGrate software; Reflecting gratings; Relief gratings

Indexed keywords

ELECTROMAGNETISM; INTEGRATION; LIGHT POLARIZATION; MATRIX ALGEBRA; NUMERICAL ANALYSIS; REFRACTIVE INDEX;

ECHELLS; RELIEF GRATINGS;

DIFFRACTION GRATINGS;

EID: 0034929421     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.424847     Document Type: Conference Paper

References (21)

1. Diffraction grating groove analysis used to predict efficiency and scatter performance
2. Rigorous integral method in application to computing diffraction on relief gratings working in wavelength range from microwaves to X-ray
3. Echelles: Scalar, electromagnetic, and real-groove properties
4. Optical components & instruments
5. Diffraction efficiency of echelles working in extremely high orders
6. Integral method for echelles covered with lossless or absorbing thin dielectric layers
7. Numerical analysis for relief gratings working in the soft X-ray and XUV region by the integral equation method
8. Modified integral method for weak convergence problems of light scattering on relief grating
9. Large ruled monolithic echelle gratings
10. Design considerations for AIRES, an airborne infra-red echelle spectrometer for SOFIA
11. EXES: An echelon-cross-echelle spectrograph for SOFIA
12. Rigorous vector theories of diffraction gratings
13. Normal incidence multilayer gratings for the extreme ultraviolet region: Experimental measurements and computational modeling
14. The preliminary optical design of AIRES: An airborne infra-red echelle spectrometer for SOFIA
15. Realizing 3D spectral imaging in the far-infrared: FIFI LS