Characterization of a flat-panel amorphous silicon detector for X-ray computed tomography

Journal of X-Ray Science and Technology

Volumn 9, Issue 1, 2001, Pages 43-53

  Lee, H R ^a   Ellingson, W ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; COMPUTERIZED TOMOGRAPHY; FLAT PANEL DISPLAYS; IMAGE RECONSTRUCTION; OPTICAL RESOLVING POWER; OPTICAL TRANSFER FUNCTION; PROJECTION SYSTEMS; X RAYS;

TWO DIMENSIONAL PROJECTION IMAGE; X RAY COMPUTED TOMOGRAPHY;

SILICON SENSORS;

EID: 0034917374     PISSN: 08953996     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)

1. Demonstration of megavoltage and diagnostic x-ray imaging with hydrogenated amorphous silicon arrays
2. Considerations for high frame rate operation of two-dimensional a-Si:H imaging arrays
3. High sensitivity readout of 2D a-Si image sensors
4. Evaluation of a microtomography system with an x-ray microfocus tube
5. Optimised detail detectability in computerized tomography
6. The physics of amorphous-silicon thin-film transistors
7. A cone beam computed tomography system for true 3D imaging of specimens
8. Amorphous semiconductors usher in digital x-ray imaging
9. An improved page-size 127 mm pixel amorphous silicon image sensor for x-ray diagnostic medical imaging applications
10. X-ray imaging using amorphous selenium: Feasibility of a flat panel self-scanned detector for digital radiology