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Volumn 63, Issue 20, 2001, Pages
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Experimental tests for the relevance of two-level systems for electron dephasing
a,b b,c,d b,e,f |
Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
ELECTRON;
ENERGY;
LOW TEMPERATURE PROCEDURES;
MATERIAL STATE;
MATHEMATICAL ANALYSIS;
TEMPERATURE DEPENDENCE;
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EID: 0034906001
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.63.201401 Document Type: Article |
Times cited : (21)
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References (21)
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