Interface dosimetry: Measurements and Monte Carlo simulations of low-energy photon beams

Radiation Physics and Chemistry

Volumn 61, Issue 3-6, 2001, Pages 593-595

  Das, Indra J ^a   Kassaee, Alireza ^a   Verhaegen, Frank ^b   Moskvin, Vadim P ^c  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b INSTITUTE OF CANCER RESEARCH   (United Kingdom)

^c INDIANA UNIVERSITY   (United States)

Author keywords

Dose perturbation; Interface dosimetry; Low energy photon; Monte Carlo simulation

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; INTERFACES (MATERIALS); MONTE CARLO METHODS; PERTURBATION TECHNIQUES; PHOTONS; TRANSPORT PROPERTIES;

INTERFACE DOSIMETRY;

DOSIMETRY;

CONFERENCE PAPER; ELECTRON BEAM; ELECTRON TRANSPORT; ENERGY TRANSFER; IONIZATION CHAMBER; LOW ENERGY RADIATION; RADIATION DOSE; SYSTEM ANALYSIS;

EID: 0034903621     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0969-806X(01)00342-5     Document Type: Conference Paper

References (8)

1. Forward dose perturbation at high atomic number interfaces in kilovoltage X-ray beams
2. Interface dosimetry in kilovoltage photon beams
3. Backscatter dose perturbation in kilovoltage photon beams at high atomic number interfaces
4. Physical and biological interface dose effects in tissue due to X-ray induced release of secondary radiation from metallic gold surfaces
5. Monte Carlo study of electron spectra and dose from backscattered radiation in the vicinity of medium interfaces for monoenergetic photons of 50-1250 keV