Interpretation of phase and strain contrast of TEM images of InxGa1-xAs/GaAs quantum dots

Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 24, 2001, Pages 2453021-2453029

  De Giorgi, M ^a   Taurino, A ^a   Passaseo, A ^a   Catalano, M ^a   Cingolani, R ^a  

^a UNIVERSITY OF SALENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; DIFFRACTION; IMAGE ANALYSIS; IMAGE QUALITY; IMAGING SYSTEM; PHASE CONTRAST MICROSCOPE; QUANTUM MECHANICS; RELIABILITY; SEMICONDUCTOR; SIGNAL DETECTION; SIMULATION; THREE DIMENSIONAL IMAGING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034895173     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (33)