Semiconductor ceramics for NTC thermistors: The reliability aspects

Journal of the European Ceramic Society

Volumn 21, Issue 10-11, 2001, Pages 1787-1791

  Altenburg, H ^a   Mrooz, O ^b   Plewa, J ^a   Shpotyuk, O ^b   Vakiv, M ^b  

^a MÜNSTER UNIVERSITY OF APPLIED SCIENCES   (Germany)

^b SCIENTIFIC RESEARCH COMPANY CARAT   (Ukraine)

Author keywords

Electrical conductivity; Electron microscopy; Spinels; Thermistors

Indexed keywords

ANNEALING; CERAMIC MATERIALS; COMPOSITION; DEGRADATION; ELECTRIC CONDUCTIVITY; HEAT TREATMENT; METALLIZING; RELIABILITY;

QUANTITATIVE PARAMETERS;

THERMISTORS;

CERAMICS;

EID: 0034892124     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(01)00116-9     Document Type: Article

References (8)

1. Negative temperature coefficient thermistors
2. Thermistors
3. Conception of electronic ceramics in relation to their functional reliability: Applications to multilayer ceramic capacitors and semiconductor ceramics
4. Correlation between the structure, the microstructure and the electrical properties of nickel manganite negative temperature coefficient (NTC) thermistors
5. Cation distribution, short-range order and small polaron hopping conduction in nickel manganites, from a neutron diffraction study
6. Metallisation of new high temperature stable negative temperature coefficient ceramic passive components
7. Thermal modification of ceramic composites based on manganese-containing cube spinels