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Volumn 39, Issue 12, 2001, Pages 1929-1930

Synthesis and characterization of silicon carbide whiskers [1]

Author keywords

A. whiskers; C. X ray diffraction; D. microstructure; Infrared spectroscopy; Scanning electron microscopy

Indexed keywords

ACTIVATED CARBON; ADSORPTION; AMORPHOUS MATERIALS; BOND STRENGTH (MATERIALS); CARBON FIBERS; CRYSTAL MICROSTRUCTURE; CRYSTAL WHISKERS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION ANALYSIS;

EID: 0034888508     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0008-6223(01)00153-1     Document Type: Letter
Times cited : (39)

References (13)
  • 3
    • 0025401705 scopus 로고
    • Whisker toughing: A comparison between aluminum oxide and silicon nitride toughened with silicon carbide
    • (1990) J Am Ceram Soc , vol.73 , pp. 521-530
    • Campbell, G.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.